Test Pattern Generation Algorithm Using Structurally Synthesized BDD

Abstract

Structurally Synthesized Binary Decision
Diagrams (SSBDDs) have an important characteristic
property of keeping information about circuit’s structure.
Boolean difference of a circuit is used to find test pattern for
stuck at fault in combinational circuit but the algebraic
manipulation involved in solving Boolean difference is a
tedious job. In this paper an efficient algorithm is proposed to
compute Boolean difference and test patterns simply using
searching the paths of SSBDD. This model reduces algebraic
manipulations and takes less time to compute the test pattern.